Scanning Electron Microscopy and X-Ray Microanalysis (Paperback)

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About the Author


This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.


Product Details
ISBN: 9781493982691
ISBN-10: 1493982699
Publisher: Springer
Publication Date: August 30th, 2018
Pages: 550
Language: English